Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Mountain View, Calif.—Synopsys Inc. announced availability of its TetraMAX small delay defect automatic test pattern generator (ATPG) for use by design organizations worldwide to improve the quality ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Traditional scan-based at-speed delay tests attempt to check for transitions at the system clock speed. For chips designed at 130-nm nodes and below, at-speed tests are no longer sufficient for ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...