Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Explore how correlative light and electron microscopy (CLEM) enables high-resolution insights into endocytic sorting.

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

Virtual apertures let researchers isolate and solve atomic structures from individual nanocrystals embedded in dense clusters, providing valuable new data for energy and pharmaceutical applications.

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Working on the nanoscale for manufacturing poses some unique challenges. While many macroscale manufacturing methods such as lithography and additive manufacturing have been successfully translated ...

Over the past few years we’ve seen several impressive projects where people try to manufacture integrated circuits using hobbyist tools. One of the most complex parts of this process is lithography: ...

FTIR microscopy offers a strong method for detecting and characterizing contaminants, crucial for ensuring product safety and ...